Optimization apparatus and control method thereof

ABSTRACT

In an optimization apparatus, a computing unit searches for the ground state of an Ising model generated by converting an optimization problem to be solved, based on Ising model information representing the Ising model and a temperature parameter. A control unit determines the minimum value of the temperature parameter, based on a resolution in energy of the computing unit for the Ising model and a first reference value indicating an acceptance probability of state transition in the Ising model at the minimum value, determines a maximum amount of change in energy, based on the Ising model information, determines the maximum value of the temperature parameter, based on the determined maximum amount of change in energy and a second reference value that is greater than the first reference value and indicates the acceptance probability at the maximum value, and sends the minimum and maximum values to the computing unit.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No.16/524,784, filed Jul. 29, 2019, which is based upon and claims thebenefit of priority of the prior Japanese Patent Application No.2018-172429, filed on Sep. 14, 2018, the entire contents of each ofwhich are incorporated herein by reference.

FIELD

The embodiments discussed herein relate to an optimization apparatus anda control method thereof.

BACKGROUND

Optimization apparatuses (sometimes called Ising machines or Boltzmannmachines) have been used to solve multivariable optimization problemsusing Ising energy functions, whereas Von Neumann computers havedifficulty in solving such optimization problems. An optimizationapparatus solves a problem by converting it into an Ising model. Here,the Ising model expresses the behavior of magnetic spins.

For example, the optimization apparatus is able to model the problemusing a neural network. In this case, a plurality of bits correspondingto a plurality of spins included in the Ising model each function as aneuron, which outputs 0 or 1 according to the values of the other bitsand weight coefficients (may be called coupling coefficients)representing the strength of interactions between the own bit and eachof the other bits. For example, the optimization apparatus finds, as asolution, the values of the bits that minimize the value of an energyfunction of the Ising model with a stochastic search method, such assimulated annealing or a replica exchange method (may be called anexchange Monte Carlo method). Hereinafter, the value of the energyfunction may be called an energy.

For example, in the simulated annealing and the replica exchange method,a probability A of accepting a state transition (flipping of a bitvalue) that causes a change in energy ΔE is defined as the followingequation (1), so that the state will reach an optimal solution in thelimit of infinite time.

A=f(−ΔE/T)=min[1, exp(−ΔE/T)]  (1)

In the equation (1), T is a temperature parameter. In the simulatedannealing, an initial temperature value is sufficiently high for aproblem, and the temperature value is decreased after every certainnumber of iterations in a stochastic search. In the replica exchangemethod, a plurality of replicas are set at different temperatures, and astochastic search is carried out in each replica at the fixedtemperature. Then, after every certain number of iterations, the states(bit values) of replicas are exchanged according to the differences inenergy and temperature between the replicas. In this connection, thetemperatures of the replicas may be exchanged, instead of the states.

See, for example, the following documents:

-   Japanese Laid-open Patent Publication No. 05-120252-   Japanese Laid-open Patent Publication No. 08-153085-   Japanese Laid-open Patent Publication No. 2016-51350-   Japanese Laid-open Patent Publication No. 2016-103282

K. Hukushima and K. Nemoto, “Exchange Monte Carlo Method and Applicationto Spin Glass Simulations”, Journal of the Physical Society of Japan,1996, Volume 65, pp. 1604-1611

Please note that optimization problems to be solved each have adifferent amount of possible change in energy. Therefore, conventionaloptimization apparatuses have difficulty in setting temperature towithin an appropriate range. If an optimization apparatus fails to settemperature to within an appropriate range, the acceptance probabilitiesof state transitions are not set appropriately, which may cause a statetransition too often or no state transition at all. This preventsconvergence to an optimal solution and thus deteriorates the accuracy ofsolution.

SUMMARY

According to one aspect, there is provided an optimization apparatusincluding: a computing unit configured to search for a ground state ofan Ising model, based on Ising model information and a temperatureparameter, the Ising model being generated by converting an optimizationproblem to be solved, the Ising model information representing the Isingmodel; and a control unit configured to determine a minimum value of thetemperature parameter, based on a resolution in energy of the computingunit for the Ising model and a first reference value indicating anacceptance probability of state transition in the Ising model at theminimum value of the temperature parameter, determine a maximum amountof change in energy, based on the Ising model information, determine amaximum value of the temperature parameter, based on a second referencevalue and the maximum amount of change in energy, the second referencevalue being greater than the first reference value and indicating theacceptance probability at the maximum value of the temperatureparameter, and send the minimum value and the maximum value to thecomputing unit.

The object and advantages of the invention will be realized and attainedby means of the elements and combinations particularly pointed out inthe claims.

It is to be understood that both the foregoing general description andthe following detailed description are exemplary and explanatory and arenot restrictive of the invention.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 illustrates an example of an optimization apparatus according toa first embodiment;

FIG. 2 illustrates an example of different changes in energy indifferent optimization problems to be solved;

FIG. 3 illustrates an example of an optimization apparatus according toa second embodiment;

FIG. 4 illustrates an example of a computing unit that searches for theground state with simulated annealing;

FIG. 5 illustrates an example of a computing circuit;

FIG. 6 illustrates an example of controlling a temperature parameter T;

FIG. 7 illustrates an example of an optimization apparatus according toa third embodiment;

FIG. 8 illustrates an example of a computing unit that searches for theground state with a replica exchange method;

FIG. 9 is a flowchart illustrating an operation flow of a control unitof the optimization apparatus according to the third embodiment;

FIG. 10 illustrates an example of an optimization apparatus according toa fourth embodiment;

FIG. 11 illustrates an example of an optimization apparatus according toa fifth embodiment;

FIG. 12 illustrates an example of an optimization apparatus according toa sixth embodiment;

FIG. 13 is a flowchart illustrating an operation flow of a control unitof the optimization apparatus according to the sixth embodiment;

FIG. 14 illustrates an example of an optimization apparatus according toa seventh embodiment;

FIG. 15 is a flowchart illustrating an operation flow of a control unitof the optimization apparatus according to the seventh embodiment; and

FIG. 16 illustrates an example of a hardware configuration of a controlapparatus.

DESCRIPTION OF EMBODIMENTS

Hereinafter, preferred embodiments will be described with reference tothe accompanying drawings.

Optimization apparatuses to be described below are each to search forthe values of bits (the ground state of an Ising model) that minimize anenergy function from combinations of the values of all bits respectivelycorresponding to all spins in the Ising model. The Ising model isgenerated by converting an optimization problem to be solved.

For example, an Ising energy function E(x) is defined as the followingequation (2).

$\begin{matrix}{{E(x)} = {{- {\sum\limits_{\langle{i,j}\rangle}{W_{ij}x_{i}x_{j}}}} - {\sum\limits_{i}{b_{i}x_{i}}}}} & (2)\end{matrix}$

The first term on the right side is to calculate the sum of the productsof the values (0 or 1) of two bits and a weight coefficient over allpossible pairs of all bits of the Ising model, which are mutuallyexclusive and collectively exhaustive. Here, x_(i) and x_(j) arevariables (may be called state variables) that represent the values ofthe i-th and j-th bits, respectively. W_(ij) is a weight coefficientthat indicates the strength of an interaction between the i-th bit andthe j-th bit. In this connection, W_(ii)=0 is true. In addition,W_(ij)=W_(ji) is often true (this means that a weight coefficient matrixis often a symmetric matrix). In addition, the weight coefficient W_(ij)has a prescribed bit width (for example, 16 bits, 32 bits, 64 bits, 128bits, or another).

The second term on the right side is to calculate the sum of theproducts of a bias coefficient and a variable representing a bit valueover all bits. Here, b_(i) is a bias coefficient of the i-th bit.

In addition, in the case where the variable x_(i) changes to 1−x_(i), anincrease in the variable x_(i) is expressed as:Δx_(i)=(1−x_(i))−x_(i)=1−2x_(i). A change in energy (the amount ofchange in energy) ΔE_(i) due to flipping of a bit value is defined asthe following equation (3).

$\begin{matrix}{{\Delta E_{i}} = {{{{E(x)}❘_{x_{i}\rightarrow{1 - x_{i}}}} - {E(x)}} = {{{- \Delta}{x_{i}\left( {{\sum\limits_{j}{W_{ij}x_{j}}} + b_{i}} \right)}} = {{- \Delta}x_{i}h_{i}}}}} & (3)\end{matrix}$

In the equation (3), Δx_(i) has a value of −1 when the variable x_(i)changes from 1 to 0, and has a value of 1 when the variable x_(i)changes from 0 to 1. h_(i) is referred to as a local field, and thechange in energy ΔE_(i) is calculated by multiplying the local fieldh_(i) by a sign (+1 or −1) according to Δx_(i).

In addition, a change in the local field h_(i) is expressed asΔh_(i)=+W_(ij) when the variable x_(j) changes from 0 to 1, and asΔh_(i)=−W_(ij) when the variable x_(j) changes from 1 to 0.

First Embodiment

FIG. 1 illustrates an example of an optimization apparatus according toa first embodiment.

The optimization apparatus 10 of the first embodiment is a single- ormulti-chip semiconductor integrated circuit (for example, fieldprogrammable gate array (FPGA) or the like). The optimization apparatus10 includes a computing unit 11 and a control unit 12.

The computing unit 11 searches for the ground state of an Ising model onthe basis of Ising model information representing the Ising model and atemperature parameter T. The Ising model information to be used by thecomputing unit 11 includes a weight coefficient set W and a biascoefficient set b. In addition, in the example of FIG. 1 , the computingunit 11 is supplied with an iteration count Nit.

For example, to search for the ground state, a stochastic search, suchas simulated annealing or a replica exchange method, is used. Thecomputing unit 11 outputs, as a result (solution) of searching for theground state, the values (state x_(out)t) of bits obtained by repeatinga process of updating the value of a bit as many times as specified bythe iteration count Nit while accepting a state transition with theprobability defined as the above-described equation (1). In addition,the computing unit 11 outputs energy E obtained in that state.

The computing unit 11 obtains the Ising model information and iterationcount Nit from a control apparatus (for example, personal computer (PC))(not illustrated), for example.

Other than the Ising model information, the control unit 12 obtains aresolution R in energy of the computing unit 11 for the Ising model, andreference values A_(min) and A_(max) for an acceptance probability ofstate transition for the Ising model, from the control apparatus (notillustrated), for example. The resolution R indicates the minimum amountof change in energy, and depends on the hardware of the computing unit11. An appropriate resolution R based on the hardware of the computingunit 11 is set by the control apparatus, for example.

The reference value A_(min) indicates an acceptance probability at aminimum value T_(min) of the temperature parameter T. The referencevalue A_(min) is set to a sufficiently small value (for example, 0.001or the like) such that the acceptance probability of state transitionleading to an energy increase at a low temperature (i.e., when thetemperature parameter T has a small value) is sufficiently low. Thereference value A_(max) is greater than the reference value A_(min) andindicates the acceptance probability at a maximum value T_(max) of thetemperature parameter T. The reference value A_(max) is set to anaverage value (for example, 0.25, 0.5, 0.75, or the like) such that theacceptance probability of state transition to any state (including astate transition leading to an energy increase) at a high temperature(i.e., when the temperature parameter T has a high value) issufficiently high.

The minimum value T_(min) is expressed as the following equation (4).

T _(min) =−R/ln(A _(min))  (4)

The control unit 12 determines the minimum value T_(min) with theequation (4) using the resolution R and the reference value A_(min).

The maximum value T_(max) is expressed as the following equation (5).

T _(max)=−max(ΔE)/In(A _(max))  (5)

In the equation (5), max(ΔE) denotes the maximum amount of change inenergy ΔE.

The control unit 12 determines max(ΔE) on the basis of the Ising modelinformation.

Assuming that the weight coefficient W_(ij) is dominant over the biascoefficient b_(i) in the above-described equation (3), max(ΔE) isapproximated by the following expression (6).

$\begin{matrix}{{\max\left( {\Delta E} \right)} \approx \frac{\left( {\sum\limits_{ij}{❘W_{ij}❘}} \right)}{N}} & (6)\end{matrix}$

In the expression (6), N denotes a total bit count in the Ising model.That is, max(ΔE) is approximated to a value calculated by dividing thesum of absolute values of the weight coefficients W_(ij) by the totalbit count N.

The control unit 12 determines max(ΔE) with the expression (6) using theweight coefficient set W and total bit count N included in the Isingmodel information. Then, the control unit 12 determines the maximumvalue T_(max) with the equation (5) using the determined max (ΔE) andthe reference value A_(max).

For example, assuming that the weight coefficients W_(ij) all take themaximum values of 16 bit signed integer, the total bit count N in theIsing model is 1024, and the bias coefficients b_(i) are ignored,max(ΔE) is calculated to be 1024×2¹⁵=33554432. Assuming thatA_(max)=0.75, T_(max) is calculated to beT_(max)=−33554432/ln(0.75)=116637202 from the equation (5). In thisconnection, in actual, it does not happen that the weight coefficientsW_(ij) all take the maximum values, and so the maximum value T_(max) islower than the above value.

In addition, in an optimization problem taking into account only theexistence or absence of interactions between bits, the weightcoefficients W_(ij) each takes any of the values 1, 0, and −1. In thiscase, max(ΔE) is calculated to be 1024×1=1024. In the case ofA_(max)=0.75, the maximum value T_(max) is calculated to beapproximately 3560.

As described above, the maximum value T_(max), greatly varies dependingon an optimization problem to be solved.

In this connection, another method of calculating max(ΔE) (for example,using the bias coefficients b_(i)) will be described later.

The control unit 12 generates temperature schedule information Tscincluding the determined minimum value T_(min) and maximum value T_(max)and sends it to the computing unit 11, for example.

In the case where the computing unit 11 employs the simulated annealingto search for the ground state, the control unit 12 additionallyincludes information indicating how to decrease the value of thetemperature parameter T in the temperature schedule information Tsc,which is then supplied to the computing unit 11. In this connection, thecontrol unit 12 may directly lower the temperature parameter T from themaximum value T_(max) to the minimum value T_(min) according to aprescribed temperature schedule.

In the case where the computing unit 11 employs the replica exchangemethod to search for the ground state, the control unit 12 determinestemperature schedule information Tsc including a value of thetemperature parameter T in a range from the maximum value T_(max) to theminimum value T_(min) for each replica included in the computing unit11, and sends it to the computing unit 11.

For example, the control unit 12 may be implemented by using anapplication-specific integrated circuit (ASIC), an FPGA, or anotherapplication-specific electronic circuit. Alternatively, the control unit12 may be a central processing unit (CPU), a digital signal processor(DSP) or another processor. In this case, the processor performs theabove-described processes by executing programs stored in a memorydevice (not illustrated).

The following describes an example of how the optimization apparatus 10of the first embodiment operates.

FIG. 1 illustrates an example of an operation flow of the control unit12 of the optimization apparatus 10. The control unit 12 obtains Isingmodel information (a total bit count N and a weight coefficient set W),an iteration count Nit, a resolution R, reference values A_(min), andA_(max), and other information from a control apparatus (notillustrated), for example (step S1). Then, the control unit 12 performsthe above-described T_(min) determination process (step S2) and T_(max)determination process (step S3), and sends temperature scheduleinformation Tsc including the minimum value T_(min) and maximum valueT_(max) to the computing unit 11 (step S4). In this connection, steps S2and S3 may be executed in reverse order.

The computing unit 11 then searches for the ground state of the Isingmodel on the basis of the temperature parameter T specified by thetemperature schedule information Tsc and the Ising model information.For example, the computing unit 11 outputs, as a result (solution) ofsearching for the ground state, the values (state x_(out)) of bitsobtained by repeating a process of updating the value of a bit as manytimes as specified by the iteration count Nit while accepting a statetransition with the probability defined as the above-described equation(1). Also, the computing unit 11 outputs energy E obtained in thatstate.

FIG. 2 illustrates an example of different changes in energy indifferent optimization problems to be solved. In FIG. 2 , the horizontalaxis represents states x, and the vertical axis represents energy E(x).

For example, the energy E(x) in an optimization problem is representedby a waveform 15 a, and the energy E(x) in another optimization problemis represented by a waveform 15 b. It is obvious from the waveforms 15 aand 15 b that the waveform 15 b has a greater amount of possible changein energy E(x) than the waveform 15 a.

Therefore, in the case of using the same temperature parameter T forsolving these optimization problems, a state transition may occur toooften in solving the optimization problem in which the energy E(x) isrepresented by the waveform 15 a. On the other hand, no state transitionmay occur at all in solving the optimization problem in which the energyE(x) is represented by the waveform 15 b. These cases would hardlyachieve convergence to an optimal solution, thereby deteriorating theaccuracy of solution.

The optimization apparatus 10 of the first embodiment determines anamount of possible change in energy on the basis of the Ising modelinformation, and determines a range of the temperature parameter T forsearching for the ground state, on the basis of the amount of change.This approach enables the computing unit 11 to perform computationwithin an appropriate range of the temperature parameter T for anoptimization problem to be solved. Therefore, it becomes possible to setan appropriate acceptance probability of state transition and thus tosuppress a deterioration in the accuracy of solution for theoptimization problem.

Second Embodiment

FIG. 3 illustrates an example of an optimization apparatus according toa second embodiment.

The optimization apparatus 20 of the second embodiment includes acomputing unit 21 and a control unit 22.

The computing unit 21 searches for the ground state of an Ising model onthe basis of Ising model information and a temperature parameter T withthe simulated annealing. The Ising model information to be used by thecomputing unit 21 includes a weight coefficient set W, a biascoefficient set b, and the initial value x_(ini) of each bit. Inaddition, in the example of FIG. 3 , the computing unit 21 is suppliedwith an iteration count Nit and temperature drop control information Tdindicating how to decrease the value of the temperature parameter T. TheIsing model information, iteration count Nit, temperature drop controlinformation Td are supplied by a control apparatus, such as a PC, forexample.

The computing unit 21 outputs, as a result (solution) of searching forthe ground state, the values (state x_(out)) of bits obtained byrepeating a process of updating the value of a bit as many times asspecified by the iteration count Nit while accepting a state transitionwith the probability defined as the above-described equation (1). Inaddition, the computing unit 21 outputs energy E obtained in that state.The example of circuitry for the computing unit 21 will be describedlater.

The control unit 22 includes an information acquisition unit 22 a, aT_(max) calculation unit 22 b, a T_(min) calculation unit 22 c, and atransmission unit 22 d.

The information acquisition unit 22 a receives the weight coefficientset W, a total bit count N, the above-described reference values A_(min)and A_(max), and a resolution R supplied by a control apparatus, such asa PC, for example.

The T_(max) calculation unit 22 b calculates max(ΔE) with theabove-described expression (6) using the weight coefficient set W andthe total bit count N, and then determines the maximum value T_(max) ofthe temperature parameter T with the equation (5) using the calculatedmax (ΔE) and the reference value A_(max).

The T_(min) calculation unit 22 c determines the minimum value T_(min)with the above-described equation (4) using the resolution R and thereference value A_(min).

The transmission unit 22 d sends the minimum value T_(min) and themaximum value T_(max) to the computing unit 21.

Example of Computing Unit 21

FIG. 4 illustrates an example of the computing unit that searches forthe ground state with the simulated annealing.

The computing unit 21 includes a storage unit 21 a, a computing circuitunit 21 b, a selection circuit unit 21 c, a state update unit 21 d, anenergy update unit 21 e, and a control circuit 21 f.

The storage unit 21 a stores therein the weight coefficient set W(weight coefficients W₁₁ to W_(NN)). For example, the storage unit 21 amay be a register, a static random access memory (SRAM), or the like.

The computing circuit unit 21 b obtains the bias coefficient set b andthe weight coefficient set W stored in the storage unit 21 a, receivesthe value of an updated bit among all bits from the state update unit 21d, and receives an index identifying the updated bit from the selectioncircuit unit 21 c. Then, on the basis of these, the computing circuitunit 21 b calculates, for each of the N bits, a change in energy of theIsing model due to a change of the bit. In addition, the computingcircuit unit 21 b determines for each of the N bits whether to acceptits update, on the basis of value inequality between thermal excitationenergy and the change in energy calculated for the bit. Then, thecomputing circuit unit 21 b outputs, with respect to each of the N bits,flag information indicating a result of determining whether to acceptits update, and the change in energy.

The thermal excitation energy is determined on the basis of a randomnumber generated by a random number generation circuit, to be describedlater, and the temperature parameter T supplied by the control circuit21 f, for example.

In the example of FIG. 4 , the computing circuit unit 21 b includes Ncomputing circuits 21 b 1, 21 b 2, . . . , and 21 bN.

The computing circuit 21 b 1 calculates the change in energy of theIsing model to be caused by changing a bit with index=1, and determineswhether to accept an update of the bit on the basis of value inequalitybetween the thermal excitation energy and the calculated change inenergy. Then, the computing circuit 21 b 1 outputs flag information andthe change in energy. The computing circuits 21 b 2 to 21 bN process theother bits with index=2 to N in the same way as the computing circuit 21b 1.

An example of circuitry for the computing circuits 21 b 1 to 21 bN willbe described later.

The selection circuit unit 21 c selects one of accepted bits whoseupdates are accepted, using a random number on the basis of the flaginformation, and outputs the flag information about the selectedaccepted bit, the change in energy, and an index identifying theaccepted bit. The selection circuit unit 21 c may generate the index byitself. Alternatively, in the case where the computing circuits 21 b 1to 21 bN each hold such an index, the selection circuit unit 21 c mayobtain the indices from the computing circuits 21 b 1 to 21 bN andoutputs the index of the selected accepted bit.

The state update unit 21 d holds the value of each bit, and updates thestored contents on the basis of the flag information and index outputfrom the selection circuit unit 21 c. The state update unit 21 d holdsthe initial value x_(ini) of each bit, and outputs, as a result ofsearching for the ground state, the values (state x_(out) of bitsobtained by repeating a process of updating the value of a bit as manytimes as specified by the iteration count Nit, under the control of thecontrol circuit 21 f.

The energy update unit 21 e updates the energy of the Ising model on thebasis of the flag information and change in energy output from theselection circuit unit 21 c. The energy update unit 21 e outputs theenergy E obtained by repeating the process of updating the value of abit as many times as specified by the iteration count Nit, under thecontrol of the control circuit 21 f.

The control circuit 21 f controls the temperature parameter T to besupplied to the computing circuit unit 21 b, on the basis of the maximumvalue T_(max) and minimum value T_(min) of the temperature parameter Tand the temperature drop control information Td. In addition, thecontrol circuit 21 f determines whether the process of updating thevalue of a bit has been repeated as many times as specified by theiteration count Nit. If the process of updating the value of a bit hasbeen repeated as many times as specified by the iteration count Nit, thecontrol circuit 21 f causes the state update unit 21 d to output thevalues of the bits held therein, and causes the energy update unit 21 eto output the energy E obtained with the values.

Example of Computing Circuit

FIG. 5 illustrates an example of a computing circuit. FIG. 5 exemplifiesthe computing circuit 21 b 1 illustrated in FIG. 4 . The other computingcircuits in FIG. 4 are implemented with the same circuitry.

The computing circuit 21 b 1 includes a ΔE calculation unit 30 and astate transition determination unit 31.

The ΔE calculation unit 30 includes selection circuits 30 a and 30 b, amultiplier 30 c, an adder 30 d, a register 30 e, a multiplier 30 f, anda selection circuit 30 g.

The selection circuit 30 a selects and outputs one of the weightcoefficients W_(ij) (j=1 to N) stored in the storage unit 21 a, on thebasis of index=j supplied by the selection circuit unit 21 c of FIG. 4 .

For example, when receiving index=N, the selection circuit 30 a selectsa weight coefficient W_(1N).

The selection circuit 30 b computes the amount of change in the bitΔx_(j) with index=j. Δx_(j) takes a value of −1 when the variable x_(j),which is the value of a bit with index=j, changes from 1 to 0, and takesa value of 1 when the variable x_(j) changes from 0 to 1. The selectioncircuit 30 b selects and outputs a value of −1 when the variable x_(j)(the updated value of the bit with index=j) supplied by the state updateunit 21 d is 0, and selects and outputs a value of 1 when the variablex_(j) is 1.

The multiplier 30 c outputs the product of the weight coefficient W_(ij)output from the selection circuit 30 a and the output value of theselection circuit 30 b.

The adder 30 d calculates the sum of the output value of the multiplier30 c and a value stored in the register 30 e and outputs the sum.

The register 30 e takes in the output value (local field h₁) of theadder 30 d in synchronization with a clock signal (not illustrated). Theregister 30 e is a flip-flop, for example. In this connection, theinitial value of the local field h₁ stored in the register 30 e is abias coefficient b₁.

The multiplier 30 f outputs the product of the local field h₁ outputfrom the register 30 e and an output value of the selection circuit 30g. This product indicates the change in energy ΔE₁.

The selection circuit 30 g computes −Δx₁. The selection circuit 30 goutputs a value of −1 when the current variable x₁ stored in the stateupdate unit 21 d is 0, and a value of 1 when the current variable x₁ is1.

The state transition determination unit 31 includes a sign inversionunit 31 a, an offset addition unit 31 b, a random number generationcircuit 31 c, a selection rule application unit 31 d, a multiplier 31 e,and a comparison circuit 31 f.

The sign inversion unit 31 a inverts a sign by multiplying the change inenergy ΔE₁ by −1.

The offset addition unit 31 b adds an offset value to the output value(−ΔE₁) of the sign inversion unit 31 a. The offset addition unit 31 bincreases the offset value if flag information flg_(j) that is suppliedby the above-described selection circuit unit 21 c indicates that thestate transition is not accepted (that is, when the state transitiondoes not occur). On the other hand, the offset addition unit 31 b setsthe offset value to zero if the flag information flg_(j) indicates thatthe state transition is accepted (that is, when the state transitionoccurs). As the offset value increases, the state transition is morelikely to be accepted. In the case where the current state is in a localsolution, an escape from the local solution is promoted.

The random number generation circuit 31 c generates a uniform randomnumber r ranging from 0 to 1, inclusive.

The selection rule application unit 31 d outputs a value under aselection rule (for example, the Metropolis method) for performing thesimulated annealing.

In the case of the simulated annealing, to define a probability A ofaccepting a state transition causing a change in energy ΔE as theequation (1), for example, ensures that a state reaches an optimalsolution in the limit of infinite time, as described earlier.

Consider the case of using the probability A defined as the equation(1). Assuming that a steady state is reached after a sufficient numberof iterations, the occupation probability of each state follows aBoltzmann distribution at thermal equilibrium in thermodynamics. Becausethe occupation probabilities of low-energy states increase as thetemperature is gradually reduced from a high value, a sufficientreduction in temperature is expected to lead to a low-energy state. Thisphenomenon is viewed as analogous to state transitions observed duringannealing of materials, and this technique is therefore called simulatedannealing. Probabilistic occurrence of a state transition leading to anenergy increase corresponds to thermal excitation in physics.

A circuit for outputting flag information (=1), which indicates that astate transition causing a change in energy ΔE is accepted with theprobability A, may be implemented using a comparator that outputs avalue based on a comparison between f(−ΔE/T) of the equation (1) and theuniform random number r.

In this connection, the same function may be implemented by thefollowing modification. In the case where the same monotonicallyincreasing function is applied to two numbers, their value inequalitydoes not change. This means that application of the same monotonicallyincreasing function to two inputs of a comparator causes no change inthe output of the comparator. For example, the inverse functionf⁻¹(−ΔE/T) of f(−ΔE/T) may be used as a monotonically increasingfunction to be applied to f(−ΔE/T), and f⁻¹(r), which uses r in place of−ΔE/T in f⁻¹(−ΔE/T), may be used as a monotonically increasing functionto be applied to the uniform random number r. In this case, it isunderstood that a circuit that outputs a value of 1 when −ΔE/T>f⁻¹(r)has the same function as the above comparator. Further, since thetemperature parameter T takes a positive value, the circuit may beconfigured to output a value of 1 when −ΔE>T·f⁻¹(r).

The selection rule application unit 31 d uses a conversion table forconverting the uniform random number r input thereto into the abovef⁻¹(r) value, in order to output the f⁻¹(r) value. In the case ofemploying the Metropolis method, f⁻¹(r) is ln(r). The conversion tableis stored in a memory device, such as random access memory (RAM) orflash memory.

The multiplier 31 e outputs the product (T·f⁻¹ (r)) of the temperatureparameter T, supplied by the control circuit 21 f, and f ⁻¹ (r). T·f⁻¹(r) corresponds to thermal excitation energy.

The comparison circuit 31 f compares T·f⁻¹(r) with the addition resultobtained by the offset addition unit 31 b, and outputs flg₁=1 as flaginformation if the addition result is greater than T·f⁻¹(r) and flg₁=0if the addition result is smaller than T·f⁻¹(r).

The following describes an example of how the optimization apparatus 20of the second embodiment operates.

The information acquisition unit 22 a of the control unit 22 obtains theIsing model information (total bit count N and weight coefficient setW), the resolution R, and the reference values A_(min) and A_(max) froma control apparatus (not illustrated), for example. Then, the T_(max)calculation unit 22 b and the T_(min) calculation unit 22 c determinethe maximum value T_(max) and minimum value T_(min) of the temperatureparameter T on the basis of the information obtained by the informationacquisition unit 22 a, and the transmission unit 22 d sends the maximumvalue T_(max) and minimum value T_(min) to the computing unit 21.

The computing unit 21 then repeats the process of updating the value ofa bit as many times as specified by the iteration count Nit whileaccepting a state transition with the probability defined as theabove-described equation (1). The control circuit 21 f of the computingunit 21 decreases the value of the temperature parameter T in accordancewith the temperature drop control information Td each time the processof updating a bit is performed a prescribed number of times (<Nit). Theinitial value of the temperature parameter T is the maximum valueT_(max) and the end value thereof is the minimum value T_(min).

FIG. 6 illustrates an example of controlling the temperature parameterT. In FIG. 6 , the horizontal axis represents values of an updateprocess count, and the vertical axis represents values of thetemperature parameter T.

The temperature parameter T decreases from the maximum value T_(max) asthe number of iterations (update process count) of the process ofupdating the value of a bit increases. The greater the update processcount, the less the amount of decrease in the temperature parameter T.When the temperature parameter T reaches the minimum value T_(min), thecontrol circuit 21 f completes its control of the temperature parameterT. In this connection, in FIG. 6 , the temperature T appears to decreasecontinuously with an increase in the update process count. However, theupdate process is performed a prescribed number of times at each valueof the temperature parameter T, as described earlier.

The computing unit 21 outputs, as a result of searching for the groundstate, the values (state x_(out)) of bits obtained by repeating theprocess of updating the value of a bit as many times as specified by theiteration count Nit. In addition, the computing unit 21 outputs energy Eobtained in that state.

The above-described optimization apparatus 20 of the second embodimentdetermines an amount of possible change in energy on the basis of theIsing model information, and determines a range of the temperatureparameter T for searching for the ground state, on the basis of theamount of change. This approach enables the computing unit 21 to performcomputation with the simulated annealing within an appropriate range ofthe temperature parameter T for an optimization problem to be solved.Therefore, it becomes possible to set an appropriate acceptanceprobability of state transition and thus to suppress a deterioration inthe accuracy of solution for the optimization problem.

Third Embodiment

FIG. 7 illustrates an example of an optimization apparatus according toa third embodiment. In FIG. 7 , the same reference numerals as used inFIG. 3 indicate the same component elements.

The optimization apparatus 40 of the third embodiment includes acomputing unit 41 and a control unit 42.

The computing unit 41 searches for the ground state of an Ising model onthe basis of Ising model information and a temperature parameter T withthe replica exchange method. The computing unit 41 has a plurality ofreplicas that perform the above-described update process with respect tothe same N bits. Each replica has a different temperature parameter T.According to the differences in energy and temperature (value of thetemperature parameter T) between the replicas, the states or the valuesof the temperature parameter T are exchanged between replicas each timethe update process is performed a prescribed number of times.

The Ising model information to be used by the computing unit 41 includesa weight coefficient set W, a bias coefficient set b, and the initialvalue x_(ini) of each bit. In addition, in the example of FIG. 7 , thecomputing unit 41 is supplied with an iteration count Nit. The Isingmodel information and iteration count Nit are supplied by a controlapparatus, such as a PC, for example.

The computing unit 41 outputs, as a result of searching for the groundstate, the values (state x_(out)) of bits that produce the minimumenergy E in a replica providing the minimum energy E after each replicarepeats the above-described update process as many times as specified bythe iteration count Nit. In addition, the computing unit 41 outputs thatminimum energy E. An example of circuitry for the computing unit 41 willbe described later.

The control unit 42 includes an information acquisition unit 42 a thatobtains the number of replicas n (hereinafter, replica count n) in thecomputing unit 41, in addition to the same information as obtained bythe information acquisition unit 22 a of the control unit 22 of theoptimization apparatus 20 of the second embodiment. The replica count nis also supplied by the control apparatus, such as a PC, for example.

In addition, the control unit 42 includes a Tsc calculation unit 42 b,which is a different feature from the control unit 22 of theoptimization apparatus 20 of the second embodiment.

The Tsc calculation unit 42 b receives the replica count n obtained bythe information acquisition unit 42 a, and the maximum value T_(max) andminimum value T_(min) of the temperature parameter T determined by aT_(max) calculation unit 22 b and a T_(min) in calculation unit 22 c.Then, the Tsc calculation unit 42 b calculates temperature scheduleinformation Tsc including n temperature parameters T₁, T₂, T₃, . . . ,T_(n) in a range from the maximum value T_(max) to the minimum valueT_(min) on the basis of the replica count n, maximum value T_(max), andminimum value T_(min).

For example, the temperature parameters T₁ to T_(n) are calculated asT₁=T_(min), T₂=2×(T_(max)−T_(min))/(T_(n)−1),T₃=3×(T_(max)−T_(min))/(T_(max)−1), . . . , and T_(n)=T_(max).

In this connection, the temperature parameters T₁ to T_(n) may begenerated so as to form an arithmetic progression or geometricprogression.

A transmission unit 42 c sends the temperature schedule information Tscto the computing unit 41.

Example of Computing Unit 41

FIG. 8 illustrates an example of the computing unit that searches forthe ground state with the replica exchange method.

The computing unit 41 includes n replicas 41 a 1, 41 a 2, . . . , 41 anand an exchange control unit 41 b.

Each of the n replicas 41 a 1 to 41 an includes a storage unit 21 a, acomputing circuit unit 21 b, a selection circuit unit 21 c, a stateupdate unit 21 d, and an energy update unit 21 e as illustrated in FIG.4 . The replicas 41 a 1 to 41 an each hold therein the same weightcoefficient set W, and also have the same bias coefficient set b and thesame initial values x_(ini) set therein. In addition, the replicas 41 a1 to 41 an have different temperature parameters T (each has any one ofthe temperature parameters T₁ to T_(n)) set by the exchange control unit41 b. The replicas 41 a 1 to 41 an each perform a process of updatingthe value of a bit using the corresponding temperature parameter T.

In this connection, each of the replicas 41 a 1 to 41 an holds theminimum energy value as of the present time point and a state in whichthe minimum energy value is obtained.

The exchange control unit 41 b sets different temperature parameters Tin the n replicas 41 a 1 to 41 an on the basis of the temperatureschedule information Tsc. In addition, the exchange control unit 41 bmonitors the energies in the replicas 41 a 1 to 41 an each time theupdate process is performed a prescribed number of times in the replicas41 a 1 to 41 an. Then, the exchange control unit 41 b exchanges thetemperature parameters T between two of the replicas 41 a 1 to 41 anwith an exchange probability defined as the following equation (7) usingthe energies and temperature parameters of the two replicas. In thisconnection, the exchange control unit 41 b may exchange the statesbetween the two replicas, instead of the temperature parameters T.

p _(ij) =f((1/T _(i)−1/T _(j))(E _(i) −E _(j)))  (7)

In the equation (7), T_(i) is a temperature parameter set in the i-threplica among the replicas 41 a 1 to 41 an. T_(j) is a temperatureparameter set in the j-th replica among the replicas 41 a 1 to 41 an.E_(i) denotes an energy in the i-th replica among the replicas 41 a 1 to41 an. E_(j) denotes an energy in the j-th replica among the replicas 41a 1 to 41 an. The function f in the equation (7) is the same as that inthe equation (1), and includes (1/T_(i)−1/T_(j)) (E_(i)−E_(j)) in placeof −ΔE/T in min[1,exp(−ΔE/T)] of the equation (1).

Even through the above exchange, a probability distribution of states ata value of each of these temperature parameters T converges to theBoltzmann distribution at the value of the temperature parameter T. Inthis connection, two replicas whose temperature parameters T have valuesclose to each other are selected for the exchange so as not to producetoo small exchange probability.

When the number of iterations of the process of updating the value of abit in the replicas 41 a 1 to 41 an reaches the iteration count Nit, theexchange control unit 41 b obtains the minimum energy value in each ofthe replicas 41 a 1 to 41 an and the state in which the minimum energyvalue is obtained. Then, the exchange control unit 41 b outputs theminimum energy E among the minimum energy values in the replicas 41 a 1to 41 an, and the state x_(out) in which that minimum energy E isobtained.

The following explains the example of how the optimization apparatus 40of the third embodiment operates.

FIG. 9 is a flowchart illustrating an operation flow of the control unitof the optimization apparatus according to the third embodiment.

The information acquisition unit 42 a of the control unit 42 in theoptimization apparatus 40 obtains the Ising model information (total bitcount N and weight coefficient set W), the replica count n, theresolution R, and the reference values A_(min) and A_(max) from thecontrol apparatus (not illustrated), for example (step S10). The T_(max)calculation unit 22 b and the T_(min) calculation unit 22 c determinesthe maximum value T_(max) and minimum value T_(min) of the temperatureparameter T on the basis of the information obtained by the informationacquisition unit 42 a (steps S11 and S12). After that, the Tsccalculation unit 42 b calculates temperature schedule information Tscincluding n temperature parameters T₁, T₂, T₃, . . . , and T_(n) in arange from the maximum value T_(max) to the minimum value T_(min) on thebasis of the replica count n, maximum value T_(max), and minimum valueT_(min) (step S13). Then, the transmission unit 42 c sends thetemperature schedule information Tsc to the computing unit 41 (stepS14).

The control unit 42 now completes its processing. Then, the computingunit 41 starts its processing. In this connection, steps S11 and S12 maybe executed in reverse order.

Each replica 41 a 1 to 41 an of the computing unit 41 repeats theprocess of updating the value of a bit as many times as specified by theiteration count Nit while accepting a state transition with theprobability defined as the above-described equation (1). The exchangecontrol unit 41 b exchanges the temperature parameters T between tworeplicas with the exchange probability defined as the equation (7) eachtime the update process is performed a prescribed number of times in thereplicas 41 a 1 to 41 an. Then, when the number of iterations of theupdate process in the replicas 41 a 1 to 41 an reaches the iterationcount Nit, the exchange control unit 41 b obtains the minimum energyvalue in each of the replicas 41 a 1 to 41 an and a state in which theminimum energy value is obtained. Then, the exchange control unit 41 boutputs the minimum energy E among the minimum energy values in thereplicas 41 a 1 to 41 an, and the state x_(out) in which the minimumenergy E is obtained.

The above-described optimization apparatus 40 of the third embodimentdetermines an amount of possible change in energy on the basis of theIsing model information, and determines a range of the temperatureparameter T for searching for the ground state on the basis of theamount of change. This approach enables the computing unit 41 to performcomputation with the replica exchange method within an appropriate rangeof the temperature parameter T for an optimization problem to be solved.Therefore, it becomes possible to set an appropriate acceptanceprobability of state transition and thus to suppress a deterioration inthe accuracy of solution for the optimization problem.

Fourth Embodiment

FIG. 10 illustrates an example of an optimization apparatus according toa fourth embodiment. In FIG. 10 , the same reference numerals as used inFIG. 3 indicate the same component elements.

In the optimization apparatus 50 of the fourth embodiment, aninformation acquisition unit 51 a of a control unit 51 obtains a biascoefficient set b, in addition to a resolution R, reference valuesA_(min) and A_(max), and Ising model information including a total bitcount N and a weight coefficient set W, from a control apparatus (notillustrated), for example.

Then, a T_(max) calculation unit 51 b determines max(ΔE) with thefollowing expression (8) using the weight coefficient set W, total bitcount N, and bias coefficient set b.

$\begin{matrix}{{\max\left( {\Delta E} \right)} \approx {\frac{\left( {\sum\limits_{ij}{❘W_{ij}❘}} \right)}{N} + {\max\left( {❘b❘} \right)}}} & (8)\end{matrix}$

In the expression (8), max(|b|) denotes the maximum value among theabsolute values of bias coefficients of all bits included in the Isingmodel information.

Then, the T_(max) calculation unit 51 b determines the maximum valueT_(max) of the temperature parameter T with the equation (5) using thedetermined max(ΔE) and the reference value A_(max).

The other component elements in the optimization apparatus 50 operate inthe same way as the corresponding ones in the optimization apparatus 20of the second embodiment.

Since max(ΔE) is determined taking into account the bias coefficient setb, max(ΔE) is obtained with more accuracy. Then, the maximum valueT_(max) of the temperature parameter T is determined using thus obtainedmax(ΔE). By doing so, it is possible to set a more appropriate range ofthe temperature parameter T for an optimization problem to be solved.

Fifth Embodiment

FIG. 11 illustrates an example of an optimization apparatus according toa fifth embodiment. In FIG. 11 , the same reference numerals as used inFIG. 7 indicate the same component elements.

In the optimization apparatus 60 of the fifth embodiment, an informationacquisition unit 61 a of a control unit 61 obtains a bias coefficientset b, in addition to a resolution R, reference values A_(min) andA_(max) a replica count n, a total bit count N, and a weight coefficientset W, from a control apparatus (not illustrated), for example.

Then, a T_(max) calculation unit 61 b determines max(ΔE) with theabove-described expression (8) using the weight coefficient set W, totalbit count N, and bias coefficient set b.

Then, the T_(max) calculation unit 61 b determines the maximum valueT_(max) of the temperature parameter T with the equation (5) using thedetermined max (LE) and reference value A_(max).

The other component elements in the optimization apparatus 60 operate inthe same way as the corresponding ones in the optimization apparatus 40of the third embodiment.

The above-described optimization apparatus 60 of the fifth embodimentprovides the same effects as the optimization apparatus 50 of the fourthembodiment.

Sixth Embodiment

FIG. 12 illustrates an example of an optimization apparatus according toa sixth embodiment. In FIG. 12 , the same reference numerals as used inFIG. 10 indicate the same component elements.

The optimization apparatus 70 of the sixth embodiment has almost thesame configuration as the optimization apparatus 50 of FIG. 10 , exceptthat a T_(max) calculation unit 71 a of a control unit 71 calculates themaximum amount of change in energy for each bit with the followingexpression (9).

$\begin{matrix}{{\max\left( {\Delta E_{i}} \right)} \approx {{\sum\limits_{j}{❘W_{ij}❘}} + {❘b_{i}❘}}} & (9)\end{matrix}$

In the expression (9), max(ΔE_(i)) denotes the maximum amount of changein energy for the i-th bit (i=1 to N). max(ΔE) used in the equation (5)refers to the maximum of the maximum amounts of change in energyrespectively caused by changing all bits, and is expressed as thefollowing expression (10).

$\begin{matrix}{{\max\left( {\Delta E} \right)} \approx {\max\left( {{\sum\limits_{j}{❘W_{ij}❘}} + {❘b_{i}❘}} \right)}} & (10)\end{matrix}$

The T_(max) calculation unit 71 a calculates max (ΔE) from the maximumamounts (max(ΔE_(i))) of change in energy respectively calculated forall bits, and determines the maximum value T_(max) of the temperatureparameter T with the equation (5) using the calculated max(ΔE) and thereference value A_(max).

The other component elements in the optimization apparatus 70 operate inthe same way as the corresponding ones in the optimization apparatus 50of the fourth embodiment.

FIG. 13 is a flowchart illustrating the operation flow of the controlunit of the optimization apparatus according to the sixth embodiment.

An information acquisition unit 51 a of the control unit 71 in theoptimization apparatus 70 obtains the Ising model information (total bitcount N, weight coefficient set W, and bias coefficient set b), theresolution R, and the reference values A_(min) and A_(max) from acontrol apparatus (not illustrated), for example (step S20). Then, aT_(min) calculation unit 22 c determines the minimum value T_(min) withthe above-described equation (4) using the resolution R and referencevalue A_(min) (step S21).

The T_(max) calculation unit 71 a executes the following steps S22 a,S22 b, and S22 c as a process of determining the maximum value T_(max)(step S22). The T_(max) calculation unit 71 a calculates the maximumamount (max(ΔE_(i))) of change in energy for each bit (step S22 a), andcalculates max(ΔE) from the maximum amounts (max(ΔE_(i))) of change inenergy respectively calculated for the bits (step S22 b). Then, theT_(max) calculation unit 71 a calculates the maximum value T_(max) ofthe temperature parameter T on the basis of the calculated max(ΔE) andreference value A_(max) (step S22 c).

Then, the transmission unit 22 d sends the minimum value T_(min) and themaximum value T_(max) to a computing unit 21 (step S23).

The control unit 71 now completes its processing. Then, the computingunit 21 starts its processing as described earlier. In this connection,steps S21 and S22 may be executed in reverse order.

The above-described optimization apparatus 70 of the sixth embodimentdetermines max(ΔE) from the maximum amounts of change in energyrespectively calculated for all bits, so that max(ΔE) is obtained withmore accuracy. Then, the optimization apparatus 70 determines themaximum value T_(max) of the temperature parameter T using that max(ΔE).Thus, it is possible to set a more appropriate range of the temperatureparameter T for an optimization problem to be solved.

Seventh Embodiment

FIG. 14 illustrates an example of an optimization apparatus according toa seventh embodiment. In FIG. 14 , the same reference numerals as usedin FIG. 11 indicate the same component elements.

The optimization apparatus 80 of the seventh embodiment has almost thesame configuration as the optimization apparatus 60 of FIG. 11 , exceptthat a T_(max) calculation unit 81 a of a control unit 81 calculates themaximum amount of change in energy for each bit with the above-describedexpression (9), calculates max(ΔE) to be used in the equation (5) withthe above-described expression (10), and determines the maximum valueT_(max) of the temperature parameter T with the equation (5) using thecalculated max(ΔE) and a reference value A_(max).

The other component elements in the optimization apparatus 80 operate inthe same way as the corresponding ones in the optimization apparatus 60of the fifth embodiment.

FIG. 15 is a flowchart illustrating an operation flow of the controlunit of the optimization apparatus according to the seventh embodiment.

An information acquisition unit 61 a of the control unit 81 in theoptimization apparatus 80 obtains a bias coefficient set b, in additionto a resolution R, reference values A_(min) and A_(max), a replica countn, a total bit count N, and a weight coefficient set W, from a controlapparatus (not illustrated), for example (step S30). Then, a T_(min)calculation unit 22 c determines the minimum value T_(min) with theabove-described equation (4) using the resolution R and reference valueA_(min) (step S31).

The T_(max) calculation unit 81 a executes the following steps S32 a,S32 b, and S32 c as a process of determining the maximum value T_(max)(step S32). The T_(max) calculation unit 81 a calculates the maximumamount (max(ΔE_(i))) of change in energy for each bit (step S32 a), andcalculates max(ΔE) from the maximum amounts (max(ΔE_(i))) of change inenergy respectively calculated for the bits (step S32 b). Then, theT_(max) calculation unit 81 a calculates the maximum value T_(max) ofthe temperature parameter T on the basis of the calculated max(ΔE) andreference value A_(max) (step S32 c).

Then, a Tsc calculation unit 42 b calculates temperature scheduleinformation Tsc including n temperature parameters T₁, T₂, T₃, . . . ,T_(n) in a range from the maximum value T_(max) to the minimum valueT_(min) on the basis of the replica count n, the maximum value T_(max)and the minimum value T_(min) (step S33). Then, the transmission unit 42c sends the temperature schedule information Tsc to the computing unit41 (step S34).

The control unit 81 now completes its processing. Then, the computingunit 41 starts its processing. In this connection, steps S31 and S32 maybe executed in reverse order.

The above-described optimization apparatus 80 of the seventh embodimentprovides the same effects as the optimization apparatus 70 of the sixthembodiment.

In this connection, in the above-described optimization apparatuses 70and 80, the control units 71 and 81 each determine max(ΔE) taking intoaccount the influence of the bias coefficient set b. However, if theweight coefficient set W is dominant over the bias coefficient set b,the influence of the bias coefficient set b does not need to be takeninto account.

By the way, the functions of each of the control units 12, 22, 42, 51,61, 71, and 81 of the above-described optimization apparatuses 10, 20,40, 50, 60, 70, and 80 may be implemented by causing a processor in acontrol apparatus, such as a PC, to execute a control program, forexample.

FIG. 16 illustrates an example of a hardware configuration of thecontrol apparatus.

The control apparatus 90 includes a CPU 91, a RAM 92, a hard disk drive(HDD) 93, a video signal processing unit 94, an input signal processingunit 95, a media reader 96, a communication interface 97, and aninterface 98. These units are connected to a bus.

The CPU 91 is a processor including a computational circuit thatexecutes program instructions. The CPU 91 loads at least part of aprogram and data from the HDD 93 to the RAM 92 and runs the program. Inthis connection, the CPU 91 may include a plurality of processor cores.Alternatively, the control apparatus 90 may include a plurality ofprocessors. The control of an optimization apparatus 98 a may beexecuted by using a plurality of processors or processor cores inparallel.

The RAM 92 is a volatile semiconductor memory device that temporarilystores therein programs to be executed by the CPU 91 and data to be usedin operations by the CPU 91. Note that the control apparatus 90 may beprovided with a different type of memory device than RAM, or may beprovided with a plurality of memory devices.

The HDD 93 is a non-volatile storage device that stores therein softwareprograms, such as an operating system (OS), middleware, and applicationsoftware, and data. For example, the programs include a control programfor determining the minimum value T_(min) and maximum value T_(max) ofthe above-described temperature parameter T, and sending them to acomputing unit 98 a 1 of the optimization apparatus 98 a to cause it tosearch for the ground state of an Ising model within an appropriatetemperature range. Note that the control apparatus 90 may be providedwith a different type of storage device, such as a flash memory or asolid state drive (SSD), or may be provided with a plurality ofnon-volatile storage devices.

The video signal processing unit 94 outputs images (for example, animage providing a result of solving an optimization problem) to adisplay 94 a connected to the control apparatus 90 in accordance withcommands from the CPU 91. The display 94 a may be any type of display,such as a cathode ray tube (CRT) display, a liquid crystal display(LCD), a plasma display panel (PDP), or an organic electro-luminescence(OEL) display.

The input signal processing unit 95 receives an input signal from aninput device 95 a connected to the control apparatus 90 and outputs theinput signal to the CPU 91. As the input device 95 a, a pointing device,such as a mouse, a touch panel, a touchpad, or a trackball, a keyboard,a remote controller, a button switch, or another may be used. Pluraltypes of input devices may be connected to the control apparatus 90.

The media reader 96 is a reading device for reading programs and datafrom a recording medium 96 a. The recording medium 96 a may be, forexample, a magnetic disk, an optical disc, a magneto-optical disk (MO),or a semiconductor memory device. Examples of magnetic disks includeflexible disks (FDs) and HDDs. Examples of optical discs include compactdiscs (CDs) and digital versatile discs (DVDs).

The media reader 96 copies programs and data read out from the recordingmedium 96 a to a different recording medium, such as the RAM 92 or theHDD 93, for example. The read programs are executed, for example, by theCPU 91. Note that the recording medium 96 a may be a portable recordingmedium and used to distribute the programs and data. The recordingmedium 96 a and the HDD 93 are sometimes referred to ascomputer-readable recording media.

The communication interface 97 is connected to a network 97 a, andcommunicates with other information processing apparatuses over thenetwork 97 a. The communication interface 97 may be a wiredcommunication interface that is connected to a communication device suchas a switch with a cable, or a wireless communication interface that isconnected to a base station with a wireless link.

The interface 98 performs communication with the optimization apparatus98 a. The computing unit 98 a 1 of the optimization apparatus 98 a is,for example, one of the computing units 11, 21, and 41 in theoptimization apparatuses 10, 20, 40, 50, 60, 70, and 80 of the first toseventh embodiments.

As described earlier, the processing contents of the above-describedcontrol apparatus 90 are implemented by causing a computer to executeprograms.

The programs may be recorded on a computer-readable recording medium(for example, recording medium 96 a). The recording medium may be, forexample, a magnetic disk, an optical disc, a magneto-optical disk, or asemiconductor memory device. Examples of magnetic disks include FDs andHDDs. Examples of optical discs include CDs, recordable compact discs(CD-Rs), rewritable compact discs (CD-RWs), DVDs, DVD-Rs, and DVD-RWs.The programs may be recorded on portable recording media that are thendistributed. In this case, the programs may be copied from a portablerecording medium to another recording medium (for example, HDD 93) andthen executed.

Heretofore, one aspect of an optimization apparatus, a control method ofthe optimization apparatus, and a control program of the optimizationapparatus has been described with reference to the embodiments. However,these are just an example and are not limited to the above description.

According to one aspect, the above-described embodiments make itpossible to suppress a deterioration in the accuracy of solutions foroptimization problems.

All examples and conditional language provided herein are intended forthe pedagogical purposes of aiding the reader in understanding theinvention and the concepts contributed by the inventor to further theart, and are not to be construed as limitations to such specificallyrecited examples and conditions, nor does the organization of suchexamples in the specification relate to a showing of the superiority andinferiority of the invention. Although one or more embodiments of thepresent invention have been described in detail, it should be understoodthat various changes, substitutions, and alterations could be madehereto without departing from the spirit and scope of the invention.

What is claimed is:
 1. An information processing apparatus comprising: acomputing circuit configured to search for a ground state of an Isingmodel, based on Ising model information and a temperature parameter, theIsing model information representing the Ising model; and a controlcircuit configured to determine a minimum value of the temperatureparameter by dividing a resolution in value of the Ising modelinformation by a natural logarithm of a first reference value, whereinthe first reference value indicates an acceptance probability of statetransition in the Ising model at the minimum value of the temperatureparameter, and the resolution is associated with the computing circuit,determine a maximum amount of change in the value of the Ising modelinformation, based on the Ising model information, determine a maximumvalue of the temperature parameter, based on the maximum amount ofchange in the value of the Ising model information and a secondreference value, the second reference value being greater than the firstreference value and indicating the acceptance probability at the maximumvalue of the temperature parameter, and set the minimum value and themaximum value in the computing circuit.
 2. The information processingapparatus according to claim 1, wherein the control circuit determinesthe maximum amount of change by dividing the maximum amount of change bya natural logarithm of the second reference value.
 3. The informationprocessing apparatus according to claim 1, wherein the control circuitdetermines the maximum amount of change by dividing a sum of absolutevalues of weight coefficients included in the Ising model information bya total bit count of the Ising model.
 4. The information processingapparatus according to claim 1, wherein the control circuit determinesthe maximum amount of change by dividing a sum of absolute values ofweight coefficients included in the Ising model information by a totalbit count of the Ising model and adding, to a result of the dividing, amaximum value among absolute values of bias coefficients of all bitsincluded in the Ising model information.
 5. The information processingapparatus according to claim 1, wherein the control circuit calculatesfirst maximum amounts of change that are respectively caused by changingall bits included in the Ising model, and determines, as the maximumamount of change, a maximum of the first maximum amounts respectivelycalculated for all the bits.
 6. The information processing apparatusaccording to claim 1, wherein the computing circuit searches for theground state with simulated annealing by receiving temperature dropcontrol information indicating how to decrease a value of thetemperature parameter and decreasing the value of the temperatureparameter from the maximum value to the minimum value in accordance withthe temperature drop control information.
 7. The information processingapparatus according to claim 1, wherein: the computing circuit includesreplicas each of which performs update process with respect to same bitsof the Ising model and the computing circuit searches for the groundstate with a replica exchange method by using the replicas; and thecontrol circuit determines temperature schedule information including,for each of the replicas, a value of the temperature parameter in arange from the maximum value to the minimum value, and sends thetemperature schedule information to the computing circuit.
 8. A controlmethod of an information processing apparatus, the control methodcomprising: determining, by a control circuit of the informationprocessing apparatus, a minimum value of a temperature parameter bydividing a resolution in value of Ising model information by a naturallogarithm of a first reference value, the first reference valueindicating an acceptance probability of state transition in a Isingmodel at the minimum value of the temperature parameter, wherein acomputing circuit is configured to search for a ground state of theIsing model, based on the Ising model information representing the Isingmodel and the temperature parameter, wherein the resolution isassociated with the computing circuit; determining, by the controlcircuit, a maximum amount of change, based on the Ising modelinformation; determining, by the control circuit, a maximum value of thetemperature parameter based on the maximum amount of change and a secondreference value, the second reference value being greater than the firstreference value and indicating the acceptance probability at the maximumvalue of the temperature parameter; and setting, by the control circuit,the minimum value and the maximum value in the computing circuit.
 9. Anon-transitory computer-readable recording medium storing a controlprogram of an information processing apparatus that causes a computer toexecute a process comprising: determining a minimum value of atemperature parameter by dividing a resolution in value of Ising modelinformation by a natural logarithm of a first reference value, the firstreference value indicating an acceptance probability of state transitionin a Ising model at the minimum value of the temperature parameter,wherein a computing circuit is configured to search for a ground stateof the Ising model, based on the Ising model information representingthe Ising model and the temperature parameter, wherein the resolution isassociated with the computing circuit; determining a maximum amount ofchange, based on the Ising model information; determining a maximumvalue of the temperature parameter based on the maximum amount of changeand a second reference value, the second reference value being greaterthan the first reference value and indicating the acceptance probabilityat the maximum value of the temperature parameter; and setting theminimum value and the maximum value in the computing circuit.